🚚 gratis SHIPPING on orders over $50 | ⭐ 4.9/5 from 650+ reviews
Outdoor✓ In Stock🔥 Bestseller

Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

★★★★★ 4.9 out of 5(650 reviews)
Special Offer Price
$9.99
$16.65
Sale
✓ no-cost dispatch on this item • Limited time offer

Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, Pre-Owned in GOOD condition.  Book has several underlining and high-lighting.  May contain inscriptions on inside of front or back cover.Shipped with USPS Media Mail.

🔒
Secure Checkout
🚚
speedy fulfillment
↩️
accessible Returns

📋 Product Description

Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, 
Pre-Owned in GOOD condition.  Book has assorted underlining and high-lighting.  May contain inscriptions on inside of front or back cover.
Shipped with USPS Media Mail.

This product is outstanding for anyone looking for quality Outdoor products.

📐 Specifications

SKU: 165724

Category: Outdoor > Live Plants > Perennial Plants

Original Price: $16.65 USD

Sale Price: $9.99 USD​

Availability: In Stock

Condition: Brand latest

🚚 distribution & Returns

✓ at no charge shipment on orders over $50

Standard shipment: 3-5 business days

Express shipping: 1-2 business days (+$9.99)

30-Day Returns: Not satisfied? Return within 30 days for a full refund.

Recommended For You

4.9
★★★★★
Based on 8261 reviews
SM
Sarah Miller ✓ Verified Purchase
3 weeks ago · Omaha, NE
★★★★★
So glad I bought this
So far, it is uncomplicated to use and I’m satisfied.
15 people found this helpful
AW
Ashley White ✓ Verified Purchase
6 months ago · Virginia Beach, VA

★★★★★
Exceptional quality
So far, it does the job and it’s fine overall.
10 people found this helpful
LN
Lauren Nelson ✓ Verified Purchase​
3 months ago · Austin, TX
★★★★☆
leading purchase ever
In daily use, the Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, feels okay and I’m satisfied.
45 people found this helpful
WG
William Garcia ✓ Verified Purchase
6 months ago · Orlando, FL
★★★★★
Exceptional quality
Personally, the Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, is user-friendly to use and it meets expectations.
2 people found this helpful
JD
John Davidson ✓ Verified Purchase
5 months ago · Los Angeles, CA
★★★★★
remarkably happy
In daily use, the Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, is practical which feels reasonable.
11 people found this helpful